| Transmission Electron Microscopy: A Textbook for Materials Science |  | Authors: David B. Williams, C. Barry Carter Publisher: Springer Category: Book
List Price: $99.00 Buy New: $57.13 as of 9/6/2010 09:40 CDT details You Save: $41.87 (42%)
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Seller: Amazon.com Rating: 15 reviews Sales Rank: 90,674
Media: Paperback Edition: 2nd Pages: 832 Number Of Items: 4 Shipping Weight (lbs): 6.5 Dimensions (in): 11 x 8.3 x 2.1
ISBN: 0387765026 Dewey Decimal Number: 620 EAN: 9780387765020 ASIN: 0387765026
Publication Date: August 5, 2009 Shipping: Eligible for FREE Super Saver Shipping Availability: Usually ships in 24 hours
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Product Description
This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: `The best textbook for this audience available.' – American Scientist `Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' – Microscope `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin, May 1998 `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley
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Showing reviews 1-5 of 15
An outsatnding textbook! March 10, 2000 +++ (OR, United States) 14 out of 14 found this review helpful
I find this book probably the best textbook in materials science I ever read. Not only the authors are experts in the field of microscopy, but they also succeeded in extremely difficult task to present the complicated science of electron microscopy in a simple (but not oversimplified!) language. The book covers all major aspects of transmission electron microscopy, and contains excellent illustrations. This book is certainly a priceless asset for students. It is recommended as one of the best books at the beginning and intermediate level. If you are looking for a book to learn TEM, get this one, you will never regret!
Excellent introduction to TEM March 22, 2002 cmpst52 (Denton, NC United States) 9 out of 9 found this review helpful
In the 70's and 80's the book by Hirsch et al. was the TEM reference tome, and Eddington's book the applications manual.Time has marched on, and this book is the new replacement for both! Carter and Williams wrote a very easy to read, yet well detailed, text and reference for TEM. They cover quite literally everything, in just the right level of detail for 1st or 2nd year grad students. This book is the best way to get a quick grasp of TEM.
Seems like the best TEM book February 25, 2006 Osman Ertorer (Davis, CA USA) 1 out of 1 found this review helpful
Good for both beginners and advanced users. Easy to read and well organized. It looks like there are some mistakes in some equations but it is the best TEM book available.
Great book. March 31, 2008 F. Devaraj (Texas, USA) Great book and fast delivery.
Book is in very good condition and very good service.
Grounded in reality April 2, 2008 Zack Gainsforth (San Francisco, USA) There are a number of books on TEM, and many are good. However, this book provides a fresh angle for someone learning the subject for the first time because it focuses on what you need to know in order to carry out experiments. Obviously, there is a lot of theory about lenses and scattering. However, there are also dozens of "factoids" such as common lens settings, and most the frequent errors in field emission guns -- and how to handle those errors. My mixing the practical day to day technician's data with the more theoretical underpinning which is my wont, I found it got me up to speed and functional is a very short time. Now experieience with TEMs can carry me the rest of the way.
Showing reviews 1-5 of 15
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